Testing, diagnosis and repairing methods for NBTI-induced SRAM faults

dc.contributor.advisorLiu, Bao
dc.contributor.authorChen, Chiung-Hung
dc.contributor.committeeMemberLin, Wei-Ming
dc.contributor.committeeMemberJohn, Eugene
dc.date.accessioned2024-02-09T20:20:11Z
dc.date.available2024-02-09T20:20:11Z
dc.date.issued2014
dc.descriptionThis item is available only to currently enrolled UTSA students, faculty or staff. To download, navigate to Log In in the top right-hand corner of this screen, then select Log in with my UTSA ID.
dc.description.abstractNegative Bias Temperature Instability (NBTI) is a major Static Random Access Memory (SRAM) aging mechanism, leading to reduced read and hold static noise margins and increased soft error rate. The existing techniques include guardbanding, on-chip sensor-based detection, and recovery. In this thesis, a group of testing, diagnosis, and repairing methods for NBTI-induced memory faults are presented. The resulting observations show that NBTI leads to SRAM read errors rather than write errors. An error detection method is proposed to identify NBTI-induced memory read errors based on the existing Error Correcting Code (ECC) circuitry, differentiate them with soft errors by correction and double checking, and keep them idle for recovery. Furthermore, a predictive test method is proposed for NBTI-induced memory faults by adapting body biasing. An adaptive body biasing formula is achieved to simulate the NBTI effect. The experimental results validate the proposed methods and show that they cost little silicon area and power consumption.
dc.description.departmentElectrical and Computer Engineering
dc.format.extent59 pages
dc.format.mimetypeapplication/pdf
dc.identifier.isbn9781303919091
dc.identifier.urihttps://hdl.handle.net/20.500.12588/3205
dc.languageen
dc.subjectECC
dc.subjectNBTI
dc.subjectSoft Error
dc.subjectSRAM
dc.subject.classificationElectrical engineering
dc.subject.classificationComputer engineering
dc.subject.classificationComputer science
dc.titleTesting, diagnosis and repairing methods for NBTI-induced SRAM faults
dc.typeThesis
dc.type.dcmiText
dcterms.accessRightspq_closed
thesis.degree.departmentElectrical and Computer Engineering
thesis.degree.grantorUniversity of Texas at San Antonio
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

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