In situ transmission electron microscopy experimentation of nanostructured materials

Date
2016
Authors
Alducin, Diego
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Abstract

Due to the remarkable mechanical and electrical properties some nanostructured materials possess, it is important to be able to quantitatively characterize how these materials react under different types of stimulus. In situ transmission electron microscopy is a unique technique that allows the user to fully observe and record the crystallographic behavior of such materials undergoing a variety of tests. The crystallographic orientations silver nanowires were mapped in order to understand the structure and facets due to its geometry. Measuring the toughness and yield of the material led us to understand the anisotropic behavior of AgNWs. Depending on whether a load is applied to either a boundary between facets or on a facet will change the mechanical strength of the nanowire. By measuring the resistivity of the this material during deformation has also led us to understand that the intrinsic defects in the crystal structure of nanowires will change the way the material reacts to an electric potential. We have been also able to completely map the crystallographic orientations of very complex geometries of gold nanoparticles and characterize the weak forces involved in the manipulation if these nanoparticles. Finally, the elasticity of MoS2 was tested and found to be exponentially dependent upon the thickness of the nanosheets. However, the resistivity of this material does not seem to be affected by any type of deformation it is subjected to. The complete categorization of how materials interact with external stimulus while comparing the changes observed in its crystal structure is essential to understanding the underlying properties of nanostructured materials, which would not be possible without in situ transmission electron microscopy experimentation.

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Keywords
characterization, in situ, nanostructures, transmission electron microscopy
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Department
Physics and Astronomy